Our Department uses a variety of devices and analysis methods for research purposes.
In the following theres an outtake of these:

Core Facilities
DeviceResponsable Person
Advance Diffraktometer SystemProf. Dr. Günther Redhammer
EMXplus SpektrometerProf. Dr. Oliver Diwald
Infrarot Fourier SpektrometerProf. Dipl.-Ing. Dr. Maurizio Musso
Mikroprobe AnalysatorProf. Dr. Nicola Hüsing
Raman SpektrometersystemProf. Dipl.-Ing. Dr. Maurizio Musso
RasterelektronenmikroskopProf. Dr. Oliver Diwald
RöntgendiffraktometerProf. Dr. Günther Redhammer
Sputteranlage Clustex 100 MProf. Dr. Oliver Diwald

DeviceResponable Persons
Annealing furnaceN.N.
High Performance WorkstationJohn Dunlop
Light sheetAndreas Roschger, Heidi Pertl-Obermeyer
Thermal AnalyzerProf. Dr. Nicola Hüsing
XRF and PreparationGregor Zickler
Zwick/Roell Michael Elsässer, John Dunlop