Our Department uses a variety of devices and analysis nethods for research purposes.
In the following theres an outtake of these:
Core Facilities
Device Responsable Person
Advance Diffraktometer System Prof. Dr. Günther Redhammer
EMXplus Spektrometer Prof. Dr. Oliver Diwald
Infrarot Fourier Spektrometer Prof. Dipl.-Ing. Dr. Maurizio Musso
Mikroprobe Analysator Prof. Dr. Nicola Hüsing
Raman Spektrometersystem Prof. Dipl.-Ing. Dr. Maurizio Musso
Rasterelektronenmikroskop Prof. Dr. Oliver Diwald
Röntgendiffraktometer Prof. Dr. Günther Redhammer
Sputteranlage Clustex 100 M Prof. Dr. Oliver Diwald

Further Infrastructure
Device Responsable Person
Annealing furnace Prof. Dr. Fritz Finger
High Performance Workstation Prof. Dr. John Dunlop
Light sheet microscop Dr. Heidi Pertl-Obermeyer and Dr. Andreas Roschger
Thermal Analyzer Prof. Dr. Nicola Hüsing
XRF and Preparation Prof. Dr. Fritz Finger
Zwick/Roell Prof. Dr. John Dunlop and Dr. Michael Elsässer