Our Department uses a variety of devices and analysis methods for research purposes.
In the following theres an outtake of these:

Core Facilities
DeviceResponsable Person
Advance Diffraktometer SystemProf. Dr. Günther Redhammer
EMXplus SpektrometerProf. Dr. Oliver Diwald
Infrarot Fourier SpektrometerProf. Dipl.-Ing. Dr. Maurizio Musso
Mikroprobe AnalysatorProf. Dr. Nicola Hüsing
Raman SpektrometersystemProf. Dipl.-Ing. Dr. Maurizio Musso
RasterelektronenmikroskopProf. Dr. Oliver Diwald
RöntgendiffraktometerProf. Dr. Günther Redhammer
Sputteranlage Clustex 100 MProf. Dr. Oliver Diwald

Further Infrastructure
DeviceResponsable Person
Annealing furnaceProf. Dr. Fritz Finger
High Performance WorkstationProf. Dr. John Dunlop
Light sheet microscopDr. Heidi Pertl-Obermeyer and Dr. Andreas Roschger
Thermal AnalyzerProf. Dr. Nicola Hüsing
XRF and PreparationProf. Dr. Fritz Finger
Zwick/RoellProf. Dr. John Dunlop and Dr. Michael Elsässer