Infrastructure
Our Department uses a variety of devices and analysis methods for research purposes.
In the following theres an outtake of these:
Device | Responsable Person |
---|---|
Advance Diffraktometer System | Prof. Dr. Günther Redhammer |
EMXplus Spektrometer | Prof. Dr. Oliver Diwald |
Infrarot Fourier Spektrometer | Prof. Dipl.-Ing. Dr. Maurizio Musso |
Mikroprobe Analysator | Prof. Dr. Nicola Hüsing |
Raman Spektrometersystem | Prof. Dipl.-Ing. Dr. Maurizio Musso |
Rasterelektronenmikroskop | Prof. Dr. Oliver Diwald |
Röntgendiffraktometer | Prof. Dr. Günther Redhammer |
Sputteranlage Clustex 100 M | Prof. Dr. Oliver Diwald |
Device | Responsable Person |
---|---|
Annealing furnace | Prof. Dr. Fritz Finger |
High Performance Workstation | Prof. Dr. John Dunlop |
Light sheet microscop | Dr. Heidi Pertl-Obermeyer and Dr. Andreas Roschger |
Thermal Analyzer | Prof. Dr. Nicola Hüsing |
XRF and Preparation | Prof. Dr. Fritz Finger |
Zwick/Roell | Prof. Dr. John Dunlop and Dr. Michael Elsässer |